By Professor Bharat Bhushan, Professor Dr. Harald Fuchs, Professor Dr. Sumio Hosaka (auth.)
This quantity examines the actual and technical beginning for contemporary growth in utilized near-field scanning probe recommendations. It constitutes a well timed complete assessment of SPM purposes, now that business functions span topographic and dynamical floor experiences of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. After laying the theoretical historical past of static and dynamic strength microscopies, together with sensor expertise and tip characterization, contributions aspect functions similar to macro- and nanotribology, polymer surfaces, and roughness investigations. the ultimate half on business learn addresses unique purposes of scanning strength nanoprobes comparable to atomic manipulation and floor amendment, in addition to unmarried electron units in response to SPM. Scientists and engineers both utilizing or making plans to take advantage of SPM concepts will enjoy the overseas viewpoint assembled within the book.
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